Photonic Gated-Diode Method for Extracting the Energy-Dependent and the Spatial Distributions of Interface States in MOSFETs

نویسندگان

  • S. S. Chi
  • H. T. Kim
  • M. S. Kim
  • T. E. Kim
  • H. T. Shin
  • H. S. Park
  • D. J. Kim
  • K. S. Min
  • D. W. Kang
  • D. M. Kim
چکیده

In this paper, a new photonic gated-diode method is proposed to extract the energy-dependent and the spatial distributions of interface states in metal-oxide-semiconductor field-effect transistors (MOSFETs). For the photonic current-voltage (I-V) characterization of MOSFETs, an optical source with a photon energy less than the silicon bandgap (hν = 0.95 eV < Eg = 1.12 eV) is employed for the characterization of interface states (Eit) distributed in the photo-responsive energyband (EC-0.95 ≤ Eit ≤ EC) in MOS systems with polysilicon gates. The proposed novel method is simple and is feasible for accurate extraction of interface traps of MOSFETs.

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تاریخ انتشار 2003